1. R. Nozawa, H. Takeda, M. Ito, M. Hori, and T. Goto
    Substrate Bias Effects on Low Temperature Polycrystalline Silicon Formation Using Electron Cyclotron Resonance SiH4/H2 Plasma
    Journal of Applied Physics, Vol. 81 (12) (June 15, 1997) pp. 8035-8039,
    DOI: 10.1063/1.365408

  2. M. Ikeda, H. Ito, M. Hiramatsu, M. Hori, and T. Goto
    Effects of H, OH, and CH3 Radicals on Diamond Film Formation in Parallel-Plate Radio Frequency Plasma Reactor
    Journal of Applied Physics, Vol. 82 (8) (October 15, 1997) pp. 4055-4061,
    DOI: 10.1063/1.365715

  3. K. Miyata, H. Arai, M. Hori, and T. Goto
    Absolute Density Measurement of Cyanogen Fluoride in CHF3/N2 Electron Cyclotron Resonance Plasma Using Infrared Diode Laser Absorption
    Journal of Applied Physics, Vol. 82 (10) (November 15, 1997) pp. 4777-4780,
    DOI: 10.1063/1.366335

  4. K. Miyata, M. Hori, and T. Goto
    CFx(X=1-3) Radical Densities During Si, SiO2, and Si3N4 Etching Employing Electron Cyclotron Resonance CHF3 Plasma
    Journal of Vacuum Science Technology A, Vol. 15 (3) (May, 1997) pp. 568-572,
    DOI: 10.1116/1.580685

  5. T. Fujii, T. Yokoi, M. Hiramatsu, M. Nawata, M. Hori, T. Goto, and S. Hattori
    Low Dielectric Film Formation by Oxygen-Radical Polymerization of Laser-Evaporated Siloxane
    Journal of Vacuum Science Technology B, Vol. 15 (3) (May, 1997) pp. 746-749,
    DOI: 10.1116/1.589380

  6. S. Den, T. Kuno, M. Ito, M. Hori, T. Goto, P. Okeeffe, Y. Hayashi, and Y. Sakamoto
    Influence on Selective SiO2/Si Etching of Carbon Atoms Produced by CH4 Addition to a C4F8 Permanent Magnet Electron Cyclotron Resonance
    Journal of Vacuum Science Technology A, Vol. 15 (6) (November, 1997) pp. 2880-2884,
    DOI: 10.1116/1.580843

  7. H. Ito, M. Ikeda, M. Ito, M. Hori, T. Takeo, H. Hattori, and T. Goto
    Measurement of Carbon Atom Density in High Density Plasma Process
    Japanese Journal of Applied Physics, Vol. 36 (7A) (July, 1997) pp. L880-L882,
    DOI: 10.1143/JJAP.36.L880

  8. H. Ito, M. Ito, M. Hori, A. Kono, T. Takeo, T. Kato, and T. Goto
    Measurement of Einsteins A Coefficient of the 296.7 nm Transition Line of the Carbon Atom
    Japanese Journal of Applied Physics, Vol. 36 (12A) (December, 1997) pp. L1616-L1618,
    DOI: 10.1143/JJAP.36.L1616

  9. S. Den, P. OKeeffe, Y. Hayashi, M. Ito, M. Hori, T. Goto
    Development and characterization of a new compact microwave radical beam source
    Japanese Journal of Applied Physics, Vol. 36 (7B) (July, 1997) pp. 4588-4592,
    DOI: 10.1143/JJAP.36.4588

  10. T. Hayashi, A. Kono, and T. Goto
    Behavior of Electrons and Negative Ions in a Capacitively-Coupled Radio-Frequency NF3/Ar Plasma
    Japanese Journal of Applied Physics, Vol. 36 (7B) (July, 1997) pp. 4651-4655,
    DOI: 10.1143/JJAP.36.4651

  11. Y. Yamamoto, S. Suganuma, M. Ito, M. Hori, and T. Goto
    Effects of Dilution Gases on Si Atoms and SiHx+(x=0-3) Ions in Electron Cyclotron Resonance SiH4 Plasmas
    Japanese Journal of Applied Physics, Vol. 36 (7B) (July, 1997) pp. 4664-4669,
    DOI: 10.1143/JJAP.36.4664

  12. H. Kawasaki, H. Ohkura, T. Fukuzawa, M. Shiratani, Y. Watanabe, Y. Yamamoto, S. Suganuma, M. Hori, and T. Goto
    Roles of SiH3 and SiH2 Radicals in Particle Growth in RF Silane Plasmas
    Japanese Journal of Applied Physics, Vol. 36 (7B) (July, 1997) pp. 4985-4988,
    DOI: 10.1143/JJAP.36.4985

  13. K. Miyata, M. Hori, and T. Goto
    Kinetics of Radicals in CF4 and C4F8 Electron Cyclotron Resonance Plasmas
    Japanese Journal of Applied Physics, Vol. 36 (7B) (August, 1997) pp. 5340-5345,
    DOI: 10.1143/JJAP.36.5340