1. S. Takashima, M. Hori, and T. Goto
    Vacuum Ultraviolet Absorption Spectroscopy Employing a Microdiacharge Hollow-Cathode Lamp for Absolute Density Measurment of Hydrogen Atoms in Reactive Plasma
    Applied Physics Letters, Vol. 75 (25) (December 20, 1999) pp. 3929-3931,
    DOI: 10.1063/1.125497

  2. R. Nozawa, H. Takeda, M. Ito, M. Hori, and T. Goto
    In situ observation of hydrogenated amorphous silicon surfaces in electron cyclotron resonance hydrogen plasma annealing
    Journal of Applied Physics, Vol. 85 (2) (January 15, 1999) pp. 1172-1177,
    DOI: 10.1063/1.369242

  3. M. Inayoshi, M. Ito, M. Hori, and T. Goto
    Formation and Micromachining of Teflon (Fluorocarbon Polymer) Film by a Completely Dry Process Using Synchrotron Radiation
    Journal of Vacuum Science Technology B, Vol. 17 (3) (June, 1999) pp. 949-956,
    DOI: 10.1116/1.590676

  4. K. Fujita, M. Ito, M. Hori, and T. Goto
    Novel Process for SiO2/Si Selective Etching Using A Novel Gas Source for Preventing Global Warming
    Journal of Vacuum Science Technology B, Vol. 17 (3) (June, 1999) pp. 957-960,
    DOI: 10.1116/1.590676

  5. Kazuya Murata, Masafumi Ito, Masaru Hori, and Toshio Goto
    Control of seed layer for a low temperature formation of polycrystalline silicon with high crystallinity and a smooth surface
    Journal of Vacuum Science Technology B, Vol. 17 (3) (June, 1999) pp. 1098-1100,
    DOI: 10.1116/1.590702

  6. R. Nozawa, K. Murata, M. Ito, and T. Goto
    Low Temperature Polcrystalline Sillicon Film Formation with and without Charged Species in an Electron Cyclotron Resonance SiH4/H2 Plasma-Enhanced Chemical Vapor Deposition
    Journal of Vacuum Science Technology A, Vol. 17 (5) (September, 1999) pp. 2542-2545,
    DOI: 10.1116/1.581994

  7. K. Fujita, M. Ito, M. Hori, and T. Goto
    Silicon Oxide Selective Etching Process Keeping Harmony with Enviroment by Using Radical Injection Technique
    Journal of Vacuum Science Technology A, Vol. 17 (6) (November, 1999) pp. 3260-3264,
    DOI: 10.1116/1.582052

  8. K. Fujita, M. Ito, M. Hori, and T. Goto
    Silicon Oxide Selective Etching Process Keeping Harmony with Enviroment by Using Radical Injection Technique
    Journal of Vacuum Science Technology A, Vol. 17 (6) (November, 1999) pp. 3260-3264,
    DOI: 10.1116/1.582052

  9. A. Kono, S. Hirose, T. Goto
    CW laser-induced fluorescence study of SiH2+SiH4 reaction: Dominance of two-body reaction channel in low-pressure silane plasma
    Japanese Journal of Applied Physics, Vol. 38 (7B) (July, 1999) pp. 4389-4392,
    DOI: 10.1143/JJAP.38.4389

  10. K. Ito, K. Teii, M. Ishikawa, M. Ito, M. Hori, T. Takeo, T. Kato, and T. Goto
    Diamond deposition and behavior of atomic carbon species in a low-pressure inductively coupled plasma
    Japanese Journal of Applied Physics, Vol. 38 (7B) (July, 1999) pp. 4504-4507,
    DOI: 10.1143/JJAP.38.4504

  11. M. Nakamura, H. Nakayama, M. Ito, M. Hori, A. Kono, and T. Goto
    Spatial Distribution Measurement of Absolute Densities of CF and CF 2 Radicals in a High Density Plasma Reactor Using a Combination of Single-Path Infrared Diode Laser Absorption Spectroscopy and Laser-Induced Fluorescence Technique
    Japanese Journal of Applied Physics, Vol. 38 (12A) (December 1, 1999) pp. L1469-L1471,
    DOI: 10.1143/JJAP.38.L1469

  12. M. Hori, T. Goto, R. G. Woodham, and H. Ahmed
    Control Over Size and Density of Sub-5nm Gold Dots by Retarding-Field Single Ion Deposition (RSID)
    Micoelectronics Engineering, Vol. 47 (1-4) (June, 1999) pp. 401-403,
    DOI: 10.1016/S0167-9317(99)00244-0

  13. K. Fujita, S. Kobayashi, M. Ito, M. Hori, and T. Goto
    Environmentally harmonious etching process for cleaning amorphous silicon and tungsten in chemical vapor deposition chamber
    Material Science in Semiconductor Processing, Vol. 2 (3) (October, 1999) pp. 219-223,
    DOI: 10.1016/S1369-8001(99)00030-X

  14. B. Mebarki, S. Sumiya, R. Yoshida, M. Ito, M. Hori, T. Goto, S. Samukawa, and T. Tsukada
    Polysrystalline Sillicon Film Formation at Low Tempereture using Ultra-High-Frequency Plasma Enhanced Chemical Vapor Deposition
    Materials Letters, Vol. 41 (October, 1999) pp. 16-19,
    DOI: 10.1016/S0167-577X(99)00097-X