- K. Teii, H. Ito, M. Hori, T. Takeo, and T.Goto
Kinetics and Role of C, O, and OH in Low-Pressure Nanocrystalline Diamond Growth
Journal of Applied Physics, Vol. 87 (9) (April, 2000) pp. 4572-4579,
DOI: 10.1063/1.373104
- K. Teii, M. Hori, T. Goto, and N. Ishii
Precursors of Fluorocarbon Film Growth Studied by Mass Spectrometry
Journal of Applied Physics, Vol. 87 (10) (April, 2000) pp. 7185-7190,
DOI: 10.1063/1.372967
- H. Ito, K. Teii, H. Funakoshi, M. Hori, and T. Goto
Loss Kinetics of Carbon Atoms in Low-Pressure High Density Plasmas
Journal of Applied Physics, Vol. 88 (8) (September, 2000) pp. 4537-4541,
DOI: 10.1063/1.1314307
- S. Sumiya, Y. Mizutani, R. Yoshida, M. Hori, T. Goto, T. Tsukada, and S. Samukawa
Plasma Diagnostics and Low-Temperture Deposition of Microcrystalline Silicon films in Ultrahigh-Frequency Silane Plasma
Journal of Applied Physics, Vol. 88 (33) (June, 2000) pp. 576-581,
DOI: 10.1063/1.373698
- S. Tada, S. Takashima, M. Ito, T. Goto, and Y. Sakamoto
Measurement and Control of Absolute Nitrogen Atom Density in an Electron Beam Excited Plasma Using Vacuum Ultraviolet Absorption Spectroscopy
Journal of Applied Physics, Vol. 88 (33) (July, 2000) pp. 1756-1759,
DOI: 10.1063/1.1305559
- K. Teii, M. Hori, M. Ito, T. Goto, and N. Ishii
Study on Polymeric Neutral Species in High-Density Fluorocarbon Plasmas
Journal of Vacuum Science Technology A, Vol. 18 (1) (January, 2000) pp. 1-9,
DOI: 10.1116/1.582150
- H. Ohta, A. Nagashima, M. Ito, M. Hori, and T. Goto
Formation of Silicon Nitride Gate Dielectric Films at 300oC Employing Radical Chemical Vapor Depostion
Journal of Vacuum Science Technology B, Vol. 18 (5) (October, 2000) pp. 2486-2490,
DOI: 10.1116/1.1289549
- K. Teii, M. Hori, and T. Goto
Codeposition on Diamond Film Surface During Reactive Ion Etching In SF6 and O2 Plasmas
Journal of Vacuum Science Technology A, Vol. 18 (6) (November, 2000) pp. 2779-2784,
DOI: 10.1116/1.1316098
- A. Kono, S. Takashima, M. Hori, T. Goto
マイクロ放電光源を用いたプラズマ吸収分光計測
Journal of Plasma and Fusion Research, Vol. 76 (5) (May, 2000) pp. 460-464,
DOI: