1. M. Inayoshi, M. Hori, T. Goto, M. Hiramatsu, M. Nawate, and S. Hattori
    Formation of Polytetrafluoroethylene Thin Films by Using CO2 Laser Evaporation and XeCl Laser Ablation
    Journal of Vacuum Science Technology A, Vol. 14 (4) (Jul/Aug, 1996) pp. 1981-1985,
    DOI: 10.1116/1.580071

  2. Y. Yamamoto, M. Hori, T. Goto, and M. Hiramatsu
    Behavior of Si atoms in a silane electron cyclotron resonance plasma at high dissociations
    Journal of Vacuum Science Technology A, Vol. 14 (4) (Jul/Aug, 1996) pp. 1999-2003,
    DOI: 10.1116/1.580074

  3. K. Takahashi, M. Hori, and T. Goto
    Fluorocarbon radicals and surface reactions in fluorocarbon high density etching plasma I. O2 addition to electron cyclotron resonance plasma employing CHF3
    Journal of Vacuum Science Technology A, Vol. 14 (4) (Jul/Aug, 1996) pp. 2004-2010,
    DOI: 10.1116/1.580075

  4. K. Takahashi, M. Hori, and T. Goto
    Fluorocarbon radicals and surface reactions in fluorocarbon high density etching plasma II. H2 addition to electron cyclotron resonance plasma employing CHF3
    Journal of Vacuum Science Technology A, Vol. 14 (4) (Jul/Aug, 1996) pp. 2011-2019,
    DOI: 10.1116/1.580076

  5. K. Miyata, M. Hori, and T. Goto
    CFx radical generation by plasma interaction with fluorocarbon films on the reactor wall
    Journal of Vacuum Science Technology A, Vol. 14 (4) (Jul/Aug, 1996) pp. 2083-2087,
    DOI: 10.1116/1.580084

  6. K. Miyata, M. Hori, and T. Goto
    Infrared Diode Laser Absorption Spectroscopy Measurements of CFx(x=1-3) Radical Densities in Electron Cyclotron Resonance Plasmas Employing C4F8, C2F6, and CHF3 Gases
    Journal of Vacuum Science Technology A, Vol. 14 (4) (Jul/Aug, 1996) pp. 2343-2350,
    DOI: 10.1116/1.580020

  7. T. Fujii, T. Yokoi, M. Hiramatsu, M. Nawata, M. Hori, T. Goto, and S. Hattori
    Preparation of Polysiloxane Thin Films Using CO2 Laser Evaporation by Remote Radical Source
    Journal of Vacuum Science Technology A, Vol. 14 (5) (Sep/Oct, 1996) pp. 2849-2853,
    DOI: 10.1116/1.580234

  8. M. Hiramatsu, M. Inayoshi, K. Yamada, E. Mizuno, M. Nawata, M. Ikeda, M. Hori, and T. Goto
    Hydrogen Radical Assisted Radio-Frequency Plasma Enhanced Chemical Vapor Deposition System for Diamond Formation
    Reviews on Scientific Instruments, Vol. 67 (6) (March, 1996) pp. 2360-2356,
    DOI: 10.1063/1.1146946

  9. H. Nomura, A. Kono, and T. Goto
    Dilution-Gas Effect on the Electron Density and Temperature in an RF SiH4 Plasma Based on Microwave Cavity Resonance Measurement
    Japanese Journal of Applied Physics, Vol. 35 (6A) (June, 1996) pp. 3603-3608,
    DOI: 10.1143/JJAP.35.3603

  10. K. Takahashi, M. Inayoshi, M. Hori, and T. Goto
    Evaluation of CF2 Radical as a Precursor for Fluorocarbon Film Formation in Highly Selective SiO2 Etching Process Using Radical Injection Technique
    Japanese Journal of Applied Physics, Vol. 35 (6A) (June, 1996) pp. 3635-3641,
    DOI: 10.1143/JJAP.35.3635

  11. K. Maruyama, K. Ohkouchi, and T. Goto
    Kinetics of CFx (x=1-3) Radicals and Electrons in RF CF4-H2, CHF3-H2 and CHF3-O2 Plasmas
    Japanese Journal of Applied Physics, Vol. 35 (7A) (July, 1996) pp. 4088-4095,
    DOI: 10.1143/JJAP.35.4088

  12. M. Ikeda, E. Mizuno, M. Hori, T. Goto, K. Yamada, M. Hiramatsu, and M. Nawata
    Diamond Film Formation by OH Radical Injection from Remote Microwave H2/H2O Plasma into Parallel-Plate RF Methanol Plasma
    Japanese Journal of Applied Physics, Vol. 35 (9A) (September, 1996) pp. 4826-4832,
    DOI: 10.1143/JJAP.35.4826

  13. T. Goto, and M. Hori
    Radical Behavior in Fluorocarbon Plasma and Control of Silicon Oxide Etching by Injection of Radicals
    Japanese Journal of Applied Physics, Vol. 35 (12B) (December. 1996) pp. 6521-6527,
    DOI: 10.1143/JJAP.35.6521

  14. S. Den, T. Kuno, M. Ito, M. Hori, T. Goto, Y. Hayashi, and Y. Sakamoto
    Diagnostics of Fluorocarbon Radicals in a Large-area Permanent Magnet Electron Cyclotron Resonance Etching Plasma
    Japanese Journal of Applied Physics, Vol. 35 (12B) (December, 1996) pp. 6528-6533,
    DOI: 10.1143/JJAP.35.6528

  15. T. Goto
    Measurements of CFx and SiHx Radicals in ECR and RF Plasmas Used for Material Processing
    Pure and Applied Chemistry, Vol. 68 (5) (January, 1996) pp. 1059-1063,
    DOI: 10.1351/pac199668051059